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SEMICONDUCTOR DIAGNOSTICS, INC. - Florida Company Profile

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Company Details

Entity Name: SEMICONDUCTOR DIAGNOSTICS, INC.
Jurisdiction: FLORIDA
Filing Type: Domestic Profit
Status: Inactive
Date Filed: 02 Nov 1995 (30 years ago)
Date of dissolution: 04 Apr 2014 (11 years ago)
Last Event: VOLUNTARY DISSOLUTION
Event Date Filed: 04 Apr 2014 (11 years ago)
Document Number: P95000084308
FEI/EIN Number 593353010
Address: 3650 SPECTRUM BLVD, SUITE 130, TAMPA, FL, 33612, US
Mail Address: 3650 SPECTRUM BLVD, SUITE 130, TAMPA, FL, 33612, US
ZIP code: 33612
City: Tampa
County: Hillsborough
Place of Formation: FLORIDA

Key Officers & Management

Name Role Address
LAGOWSKI JACEK Director 4908 TURNBURY WOOD DR, TAMPA, FL, 33647
JASTRZEBSKI LUBOMIR Director 450 GULFVIEW BLVD #1705, CLEARWATER, FL, 33767
MUELLER AMY M Officer 5941 63RD TERRACE N., PINELLAS PARK, FL, 33781
FINDLAY ANDREW Officer 17633 ARCHLAND PASS RD, LUTZ, FL, 33549
LAGOWSKI JACEK Agent 3650 SPECTRUM BLVD #130, TAMPA, FL, 33612

Events

Event Type Filed Date Value Description
VOLUNTARY DISSOLUTION 2014-04-04 - -
REGISTERED AGENT ADDRESS CHANGED 1998-01-20 3650 SPECTRUM BLVD #130, TAMPA, FL 33612 -
CHANGE OF PRINCIPAL ADDRESS 1997-04-17 3650 SPECTRUM BLVD, SUITE 130, TAMPA, FL 33612 -
CHANGE OF MAILING ADDRESS 1997-04-17 3650 SPECTRUM BLVD, SUITE 130, TAMPA, FL 33612 -
NAME CHANGE AMENDMENT 1996-01-02 SEMICONDUCTOR DIAGNOSTICS, INC. -
CORPORATE MERGER 1995-12-18 - CORPORATION WAS A MERGER RESULT. TOTAL NUMBER OF QUALIFIED CORPORATION(S) INVOLVED WAS 1. CORPORATE MERGER NUMBER 300000008283

Documents

Name Date
VOLUNTARY DISSOLUTION 2014-04-04
ANNUAL REPORT 2013-01-30
ANNUAL REPORT 2012-02-09
ANNUAL REPORT 2011-02-18
ANNUAL REPORT 2010-01-16
ANNUAL REPORT 2009-03-26
ANNUAL REPORT 2008-01-25
ANNUAL REPORT 2007-01-11
ANNUAL REPORT 2006-06-01
ANNUAL REPORT 2005-01-26

Trademarks

Serial Number:
76310255
Mark:
SASS
Status:
Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this file, click on the Trademark Document Retrieval link at the top of this page.
Mark Type:
Trademark
Application Filing Date:
2001-09-07
Mark Drawing Type:
1 - TYPESET WORD(S) /LETTER(S) /NUMBER(S)
Mark Literal Elements:
SASS

Goods And Services

For:
DIAGNOSTIC TEST APPARATUS FOR MEASUREMENT OF EQUIVALENT ELECTRICAL OXIDE THICKNESS (eEOT) ON DIELECTRIC LAYERS USED IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION
First Use:
2001-05-29
International Classes:
009 - Primary Class
Class Status:
SECTION 8 - CANCELLED
Serial Number:
75521680
Mark:
COCOS
Status:
Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this file, click on the Trademark Document Retrieval link at the top of this page.
Mark Type:
Trademark
Application Filing Date:
1998-07-20
Mark Drawing Type:
1 - TYPESET WORD(S) /LETTER(S) /NUMBER(S)
Mark Literal Elements:
COCOS

Goods And Services

For:
DIAGNOSTIC TEST EQUIPMENT FOR USE IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION
First Use:
1998-04-19
International Classes:
009 - Primary Class
Class Status:
SECTION 8 - CANCELLED

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Date of last update: 03 Aug 2025

Sources: Florida Department of State